550msw Gas Analysis
Meeting DNV accuracy for chamber gas analysis at 550MSW is now simpler and less expensive using Fathom’s patented back pressure regulated gas analyser solutions.
High accuracy 550 msw Heliox Chamber Gas Analysis is now achievable on Fathom’s iGA product range.
The problem with depth
Meeting the required partial pressure accuracy requirements becomes progressively difficult when measuring chamber gas concentrations at surface pressure as equivalent concentrations decrease with chamber depths over 300 msw.
Patented Fathom High Accuracy Analysis Mode
For depths to 550 msw, Fathom’s patented High Accuracy Analysis mode now exceeds the required partial pressure accuracy by maintaining a back pressure regulated inside the sensor chain which has the effect of increasing iGA sensor accuracy as the chamber pressure increases.
Meeting DNV accuracy for chamber gas analysis at 550MSW is now simpler and less expensive using Fathom’s innovative back pressure regulated gas analyser solutions.